Configurational resonances in optical near-field microscopy: a rigorous point-dipole approach
- 1 January 1993
- journal article
- Published by Elsevier in Surface Science
- Vol. 280 (1-2) , 217-230
- https://doi.org/10.1016/0039-6028(93)90370-y
Abstract
No abstract availableKeywords
This publication has 21 references indexed in Scilit:
- Self-consistent study of dynamical and polarization effects in near-field optical microscopyJournal of the Optical Society of America B, 1992
- Coupled electromagnetic modes between a corrugated surface and a thin probe tipThe Journal of Chemical Physics, 1991
- Model for scanning tunneling optical microscopy: A microscopic self-consistent approachPhysical Review B, 1990
- External and internal reflection near field microscopy: experiments and resultsApplied Optics, 1990
- Optical interaction between a dielectric tip and a nanometric lattice: implications for near-field microscopyJournal of the Optical Society of America B, 1990
- Photon scanning tunneling microscope study of optical waveguidesApplied Physics Letters, 1990
- New form of scanning optical microscopyPhysical Review B, 1989
- Near-field optical-scanning microscopyJournal of Applied Physics, 1986
- Analyticity of the angular spectrum amplitude of scattered fields and some of its consequencesJournal of the Optical Society of America A, 1985
- Subwavelength resolution far-infrared microscopyApplied Optics, 1985