Determination of the bonding and growth of Ag on Si(100)-(2×1)
- 15 November 1988
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 38 (14) , 9889-9894
- https://doi.org/10.1103/physrevb.38.9889
Abstract
The bonding and growth of Ag on Si(100) were studied with high-resolution photoemission spectroscopy and high-energy electron diffraction. By monitoring the changes in the Si 2p core-level and Ag 4d valence-band line shapes, we have examined the chemical interaction between the Ag adatoms and Si surface dimer atoms. The Ag-to-Si bonding coordination number as a function of coverage was obtained. This number is 2 at low Ag coverages, which suggests that the bonding site for a Ag adatom is between two neighboring Si surface dimers along the direction of dimerization; the two dimer dangling bonds pointing at the Ag adatom join the two Ag sp hybrid orbitals to form two Ag-Si bonds. The growth mode was observed to be three dimensional at higher coverages. The Schottky-barrier height was measured.Keywords
This publication has 35 references indexed in Scilit:
- An investigation of the Au/Ge(001) interfaceSurface Science, 1988
- AES, LEED and TDS studies of Cu on Si(111)7 × 7 and Si(100)2 × 1Surface Science, 1987
- Registration and nucleation of the Ag/Si(111)(√3×√3)R30° structure by scanning tunneling microscopyPhysical Review Letters, 1987
- Surface and bulk core-level shifts of the Si(111)√3 √3-Ag surface: Evidence for a charged√3 √3layerPhysical Review Letters, 1987
- Formation of noble-metal-Si(100) interfacesSurface Science, 1986
- Studies of the Ag-Ge(100) interfacePhysical Review B, 1984
- The absorption of Ag on Ge(100)-(2 × 1)Solid State Communications, 1984
- Structure of the Ag on Si(111) 7 × 7 interface by means of surface exafsSurface Science, 1983
- The structure and properties of metal-semiconductor interfacesSurface Science Reports, 1982
- Ge-Ag interface at room temperature: An energy-dependent photoemission studyPhysical Review B, 1982