Application of characteristic secondary ion mass spectroscopy to phase identification in amorphous titanium carbide
- 2 May 1986
- journal article
- research article
- Published by Elsevier in Surface Science
- Vol. 171 (2) , L454-L460
- https://doi.org/10.1016/0039-6028(86)91073-3
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Molecular secondary ion mass spectrometryAnalytical Chemistry, 1980
- Application of characteristic secondary ion mass spectra to a depth analysis of copper oxide on copperRadiation Effects, 1973