Acid—base behavior of aluminum and silicon oxides — a combination of two approaches: XPS and Lewis acido-basicity; rest potential and Brönsted acido-basicity
- 1 November 1991
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 52 (3) , 205-213
- https://doi.org/10.1016/0169-4332(91)90049-p
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
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