A new method for the determination of the penetration depth of electrons in insulators
- 16 August 1973
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 18 (2) , K121-K124
- https://doi.org/10.1002/pssa.2210180254
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Eine neue methode zur Bestimmung von Zerstörungs- bzw. Ionenimplantationsprofilen in isolatorschichtenRadiation Effects, 1973
- Characterization of Silicon Dioxide Films by the Electron ProbeJournal of the Electrochemical Society, 1971
- The mechanism of exo-electron emission after excitation with electronsPhysica Status Solidi (a), 1970