XPS characterization of anodic layers grown on Ir- and Rh-implanted titanium
- 31 July 1993
- journal article
- Published by Elsevier in Electrochimica Acta
- Vol. 38 (10) , 1313-1320
- https://doi.org/10.1016/0013-4686(93)80064-7
Abstract
No abstract availableKeywords
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