Analysis of the detectability of faults by random test patterns in a special class of NAND networks
- 31 October 1973
- journal article
- Published by Elsevier in Computers and Electrical Engineering
- Vol. 1 (2) , 171-186
- https://doi.org/10.1016/0045-7906(73)90013-x
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Analyzing Errors with the Boolean DifferenceIEEE Transactions on Computers, 1968
- Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic CircuitsIEEE Transactions on Electronic Computers, 1967
- Design and Use of Fault Simulation for Saturn Computer DesignIEEE Transactions on Electronic Computers, 1967
- On Finding a Nearly Minimal Set of Fault Detection Tests for Combinational Logic NetsIEEE Transactions on Electronic Computers, 1966