Diagnosis for wiring interconnects
- 4 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 565-571
- https://doi.org/10.1109/test.1990.114069
Abstract
The authors address the problem of generating minimum test sets for diagnosing faults in wiring interconnects on printed circuit boards. It is assumed that all the nets can be accessed in parallel or through a boundary-scan chain on the board. The fault model includes multiple stuck-at and short faults. Three methods for three different diagnosis mechanisms are presented. It is also pointed out that the self-diagnosis problem is the same as the concurrent error detection problem for asymmetric errors. Thus, the diagnostic methods considered are similar to the coding methods used in concurrent error detection. All the diagnostic methods can be extended to structural tests by taking advantage of the geometry of a circuit board to produce an efficient testKeywords
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