An interferometric method of measuring tilt angles in aligned thin films of nematic liquid crystals

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Abstract
A method of measuring tilt angles in uniformly aligned thin films of a liquid crystalline material is described. Within the range 15 degrees to 75 degrees , the method is accurate to better than +or-0.5 degrees . It depends upon measuring the change in optical path length of one arm of a Michelson interferometer balanced to give the zero-order white light fringe, when a liquid crystal cell is inserted in one of two orientations relative to the incident electric vector of the incident polarised light. Accurate data on the principal refractive indices and their dispersion are required. The interpretation of the data is remarkably straightforward.

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