Characterization of ultrashort laser pulses by the method of self-diffraction
- 1 January 1986
- proceedings article
- Published by AIP Publishing in AIP Conference Proceedings
- Vol. 146 (1) , 588-589
- https://doi.org/10.1063/1.35900
Abstract
The pulsewidth and coherence time of a picosecond Nd:YAG laser has been measured by the method of self‐diffraction, either in the two pulses or in the three pulses configuration. Experimental results have been obtained with thin dye cells or thin semiconductor films. A theoretical model has been developed that explains our results.Keywords
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