Asymmetric wall structure observation by deflection pattern in transmission Lorentz microscopy
- 1 September 1984
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 20 (5) , 1876-1878
- https://doi.org/10.1109/tmag.1984.1063294
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
- Quantitative determination of magnetisation distributions in domains and domain walls by scanning transmission electron microscopyJournal of Magnetism and Magnetic Materials, 1983
- Low-angle electron deflection studies of domain wall structure in thin NiFe filmsPhysica Status Solidi (a), 1982
- Micromagnetic structures in single crystal specimens of intermediate thickness studied by Lorentz microscopyJournal of Microscopy, 1973
- Asymmetric 180° Domain Walls in Single Crystal Iron FilmsJournal of the Physics Society Japan, 1972
- Electron Images of Two‐Dimensional Domain WallsPhysica Status Solidi (b), 1972
- Two-Dimensional Bloch-Type Domain Walls in Ferromagnetic FilmsJournal of Applied Physics, 1969
- Stray‐Field‐Free Magnetization ConfigurationsPhysica Status Solidi (b), 1969
- Domain Walls in Thin Ferromagnetic Films Investigated by Low‐Angle Electron DeflectionPhysica Status Solidi (b), 1968
- Die magnetische Ablenkung von Elektronenstrahlen in dünnen EisenschichtenThe European Physical Journal A, 1961