Photo-thermal characterization of solids and thin films by optical and scanning probe techniques
- 31 March 1994
- journal article
- Published by Elsevier in Microelectronic Engineering
- Vol. 24 (1-4) , 107-112
- https://doi.org/10.1016/0167-9317(94)90060-4
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Thermal-wave imaging for nondestructive evaluationCanadian Journal of Physics, 1986
- Photoacoustic, photothermal, and related techniques: a reviewCanadian Journal of Physics, 1986
- Photothermal modulation of the gap distance in scanning tunneling microscopyApplied Physics Letters, 1986
- Scattering matrix approach to thermal wave propagation in layered structuresJournal of Applied Physics, 1985