Some considerations of selected area channelling in the scanning electron microscope
- 1 April 1969
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 2 (4) , 361-364
- https://doi.org/10.1088/0022-3735/2/4/315
Abstract
Several methods are reviewed for generating electron channelling patterns from small selected areas on bulk specimens in the scanning electron microscope. Procedures are given for indexing patterns, and it is shown that Kikuchi maps can be used for this purpose. To illustrate one possible application, the crystallographic misorientation across a low-angle boundary is determined.Keywords
This publication has 4 references indexed in Scilit:
- Optimum conditions for generating channelling patterns in the scanning electron microscopeJournal of Physics E: Scientific Instruments, 1969
- Some comments on the interpretation of the ‘kikuchi-like reflection patterns’ observed by scanning electron microscopyPhilosophical Magazine, 1967
- Kikuchi-like reflection patterns obtained with the scanning electron microscopePhilosophical Magazine, 1967
- Further Applications of Kikuchi Diffraction Patterns; Kikuchi MapsJournal of Applied Physics, 1966