High-resolution spectroscopy using an echelle spectrometer with predisperser—I. Characteristics of the instrument and approach for measuring physical line widths in an inductively coupled plasma

This publication has 43 references indexed in Scilit:

• A dual spectrometer system for reducing spectral interferences in multielement ICPES
  Spectrochimica Acta Part B: Atomic Spectroscopy, 1983
• An assessment of prominent lines in inductively-coupled argon plasmas with special reference to spectrographic general survey analysis
  Spectrochimica Acta Part B: Atomic Spectroscopy, 1983
• Blaze characteristics of echelle gratings
  Applied Optics, 1982
• Examination of the Spectral Efficiency of an Echelle Grating Monochromator
  Applied Spectroscopy, 1979
• Inductively Coupled Plasma-Atomic Emission Spectroscopy: Prominent Lines
  Applied Spectroscopy, 1979
• Echelle grating spectrometers in analytical spectrometry
  Analytical Chemistry, 1976
• Spektrochemische Spurenanalyse mit spektralaufgelösten Analysenlinien
  Analytical and Bioanalytical Chemistry, 1967
• The Shape of Spectral Lines: Tables of the Voigt Profile
  Australian Journal of Physics, 1959
• The use of echelles in spectroscopy
  Spectrochimica Acta, 1953
• The Production of Diffraction Gratings: II The Design of Echelle Gratings and Spectrographs1
  Journal of the Optical Society of America, 1949