Effect Of Added Si On The Resistivity Of Co And Ni Films

• 26 June 1986
• proceedings article
• Published by SPIE-Intl Soc Optical Eng
• https://doi.org/10.1117/12.961217

Abstract

Keywords

• ELECTRONS
• OPTICAL MICROSCOPY
• METALS
• ANNEALING
• CHEMICALS
• BACKSCATTER
• SPECTROSCOPY