The Au/CdTe interface: an investigation of electrical barriers by ballistic electron emission microscopy
- 1 April 1990
- journal article
- letter
- Published by IOP Publishing in Semiconductor Science and Technology
- Vol. 5 (4) , 348-350
- https://doi.org/10.1088/0268-1242/5/4/013
Abstract
The authors describe the application of ballistic electron emission microscopy to measure electrical barriers with nm spatial resolution. They show that the interface between Au and chemically treated CdTe is non-uniform and that problems of reproducibility are associated with small patches at the interface where the barriers are low.Keywords
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