Composition and temperature dependence of the refractive index in Cd1-xMgxTe epitaxial films
- 1 August 1994
- journal article
- Published by IOP Publishing in Semiconductor Science and Technology
- Vol. 9 (8) , 1567-1569
- https://doi.org/10.1088/0268-1242/9/8/022
Abstract
We report on optical reflection measurements on ternary alloy (CdMg)Te thin films grown by molecular beam epitaxy. Data have been obtained in the spectral range between 1.2 eV and 2.8 eV, and at temperatures between 300 K and 77 K. The reflection coefficient as a function of energy E has been theoretically described taking into account multiple reflections at the interfaces involved. The dispersion relation n2(E)=a+bE2/(1-(E/c)2) has been used. A comparison with the experimental data has yielded the refractive index as a function of energy. The value of the refractive index n is given as a function of energy for the ternary alloy (CdMg)Te for different Mg concentrations and different temperatures. These results are essential for designing efficient waveguides for semiconductor laser structures using (CdMg)Te as a base material.Keywords
This publication has 5 references indexed in Scilit:
- Stimulated emission from a (CdMg)Te separate confinement quantum well laserJournal of Applied Physics, 1994
- Optical investigation of confinement and strain effects in CdTe/(CdMg)Te quantum wellsApplied Physics Letters, 1993
- Growth of MgTe and Cd1−xMgxTe thin films by molecular beam epitaxyJournal of Crystal Growth, 1993
- Preparation and some physical properties of magnesium telluride single crystalsJournal of Crystal Growth, 1971
- Refractive Index of ZnSe, ZnTe, and CdTeJournal of Applied Physics, 1964