Error comparison for different current patterns in electrical impedance imaging
- 1 January 1988
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
Different current patterns used in electric-current computed tomography (ECCT) were compared for their sensitivity to noise. This comparison was made by examining the error produced in reconstructing one voltage pattern from measurements made using another. It was found that the adjacent-pair current pattern is more sensitive to noise than spatial trigonometric current patterns. The measured spatial trigonometric voltage patterns were not degraded when a simulated electrode contact impedance was introduced.Keywords
This publication has 2 references indexed in Scilit:
- Current topics in impedance imagingClinical Physics and Physiological Measurement, 1987
- Applied potential tomographyJournal of Physics E: Scientific Instruments, 1984