The relative importance of multiple inelastic scattering in the quantification of EELS
- 1 May 1983
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 130 (2) , 177-186
- https://doi.org/10.1111/j.1365-2818.1983.tb04216.x
Abstract
No abstract availableKeywords
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