Recombination statistics for auger effects with applications to p-n junctions
- 30 April 1963
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 6 (2) , 169-181
- https://doi.org/10.1016/0038-1101(63)90012-1
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Accurate solution of an idealized one-carrier metal-semiconductor junction problemSolid-State Electronics, 1962
- Recombination properties of manganese and gold in germaniumJournal of Physics and Chemistry of Solids, 1961
- On the Recombination Processes by the Auger EffectProgress of Theoretical Physics, 1958
- Influence of Electric Field in Diffusion Region upon Breakdown in Germanium n-p JunctionsJournal of Applied Physics, 1957
- Statistics of the Recombinations of Holes and ElectronsPhysical Review B, 1952