Failure mechanisms and qualification testing of passive components

• 1 September 2005
• journal article
• Published by Elsevier in Microelectronics Reliability
• Vol. 45  (9) , 1626-1632
• https://doi.org/10.1016/j.microrel.2005.07.085

Abstract

Keywords

• FAILURE MECHANISMS
• QUALIFICATION TESTING
• PASSIVE COMPONENTS
• MECHANISMS AND QUALIFICATION