Current-Pressure Characteristics of Ar Field Ion Source at High Pressures
- 1 March 1992
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 31 (3A) , L291-292
- https://doi.org/10.1143/jjap.31.l291
Abstract
The ion current characteristic of an Ar field ionization source as a function of pressure has been studied using a W tip. The characteristic at low pressures shows a linear relationship, while at high pressures it shows an anisotropic change. A Field Ionization Microscopy image in the latter case shows an extremely localized emission on {110} planes, which suggests the origin of the unusual characteristic at high pressures.Keywords
This publication has 2 references indexed in Scilit:
- Emission characteristics and stability of a helium field ion sourceJournal of Vacuum Science & Technology B, 1988
- Current-voltage characteristics of the helium field-ion microscopePhilosophical Magazine, 1963