Analysis of grain boundary particles by scanning Auger microscopy
- 31 July 1981
- journal article
- Published by Elsevier in Applications of Surface Science
- Vol. 8 (3) , 278-289
- https://doi.org/10.1016/0378-5963(81)90123-9
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Intergranular embrittlement in CrMoV steels: an assessment of the effects of residual impurity elements on high temperature ductility and crack growthPhilosophical Transactions of the Royal Society of London. Series A, Mathematical and Physical Sciences, 1980
- A comparison of X-ray (STEM) and Auger electron spectroscopy for the microanalysis of grain boundary segregationPhilosophical Magazine A, 1978