Comparison of the dispersion parameters from time-of-flight and photo-induced midgap absorption measurements on sputtered a-Si:H
- 31 May 1982
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 42 (7) , 533-535
- https://doi.org/10.1016/0038-1098(82)90637-8
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- Electronic Transport in Amorphous Silicon FilmsPhysical Review Letters, 1970