Ellipsometric in Situ Studies of the Growth of ZnS Film
- 1 September 1986
- journal article
- Published by Taylor & Francis in Optica Acta: International Journal of Optics
- Vol. 33 (9) , 1207-1214
- https://doi.org/10.1080/713822078
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
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- Influence of Substrate Temperature on the Condensation of Vacuum Evaporated Films of MgF2 and ZnSJournal of Vacuum Science and Technology, 1969
- Dielectric Anomaly in ZnS FilmsJournal of Applied Physics, 1962
- MASS SPECTROMETRIC STUDIES OF THE THERMODYNAMIC PROPERTIES OF GROUP III−V AND II−VI COMPOUNDS AND THE GROUP V AND VI ELEMENTSPublished by Elsevier ,1959
- Dielectric Thin Films*Journal of the Optical Society of America, 1957