Acceleration factors for plastic encapsulated semiconductor devices and their relationship to field performance
- 1 February 1975
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 14 (1) , 63-66
- https://doi.org/10.1016/0026-2714(75)90463-1
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- The accelerated ageing of plastic encapsulated semiconductor devices in environments containing a high vapour pressure of waterMicroelectronics Reliability, 1974