A quantitative AES method for the study of a monolayer over-growth of thin film
- 1 July 1979
- journal article
- Published by Elsevier in Surface Science
- Vol. 86, 54-61
- https://doi.org/10.1016/0039-6028(79)90378-9
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
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