Low-frequency dielectric constants of α-quartz, sapphire, MgF2, and MgO

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Abstract
The 1000‐Hz 300°K dielectric constants were measured for crystalline α‐quartz, sapphire, MgF2, and MgO, and polycrystalline sapphire (Lucalox), magnesium fluoride (IRTRAN 1), and magnesium oxide (IRTRAN 5). The measurements were performed using the method of substitution (two‐fluid method). The results are as follows: single‐crystal α‐quartz, εs∥=4.6368±0.001 and εs⊥=4.5208±0.001; single‐crystal sapphire, εs∥ = 11.589±0.005 and εs⊥=9.395±0.005; polycrystalline sapphire (Lucalox), εs=10.154±0.007; single‐crystal MgF2, εs∥ =4.826±0.01 and εs⊥=5.501±0.01; polycrystalline MgF2 (IRTRAN 1), εs=5.289±0.001; single‐crystal MgO, εs=9.830 ±0.001; and polycrystalline MgO (IRTRAN 5), εs=9.833±0.001, where εs∥ and εs⊥ are the dielectric constants parallel and perpendicular, respectively, to the c axis.