Comparative Study of Scanning Electron Microscopy and Electron-Acoustic Microscopy Images

• 15 January 2002
• journal article
• Published by IOP Publishing in Japanese Journal of Applied Physics
• Vol. 41  (Part 1, No) , 70-72
• https://doi.org/10.1143/jjap.41.70

Abstract

Keywords

• ULTRASONIC
• SCANNING ELECTRON MICROSCOPY
• DIFFERENCE SET
• CHIP
• COMPARATIVE ANALYSIS
• INTEGRATED CIRCUITS