An order(N) tight-binding molecular dynamics study of intrinsic defect diffusion in silicon
Open Access
- 1 July 1999
- journal article
- Published by Elsevier in Chemical Engineering Journal
- Vol. 74 (1-2) , 67-75
- https://doi.org/10.1016/s1385-8947(99)00062-5
Abstract
No abstract availableKeywords
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