Electron Spin Resonance in SiO2 Grown on Silicon
- 1 April 1966
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 5 (4) , 333
- https://doi.org/10.1143/jjap.5.333
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- The defect structure of grown silicon dioxide filmsIEEE Transactions on Electron Devices, 1965
- Investigation of thermally oxidised silicon surfaces using metal-oxide-semiconductor structuresSolid-State Electronics, 1965
- Electrochemical Phenomena in Thin Films of Silicon Dioxide on SiliconIBM Journal of Research and Development, 1964
- Mobile electric charges on insulating oxides with application to oxide covered silicon p-n junctionsSurface Science, 1964
- Electron Spin Resonance in Neutron-Irradiated QuartzJournal of Applied Physics, 1961
- Paramagnetic Resonance of Lattice Defects in Irradiated QuartzJournal of Applied Physics, 1956