The determination of the refractive index and thickness of a transparent film
- 1 October 1976
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 9 (14) , 1939-1943
- https://doi.org/10.1088/0022-3727/9/14/003
Abstract
A method in which the refractive index and thickness of a transparent film are determined simultaneously from measurements of transmittance at normal incidence is presented. This has been applied successfully to films of Ta2O5.Keywords
This publication has 4 references indexed in Scilit:
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- The optical constants of thin evaporated films of cadmium and zinc sulphidesJournal of Physics D: Applied Physics, 1975
- The determination of the optical constants of thin films from measurements of reflectance and transmittance at normal incidenceJournal of Physics D: Applied Physics, 1972
- Optical properties of thin filmsReports on Progress in Physics, 1960