Random pattern testability of delay faults
- 1 March 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. 37 (3) , 291-300
- https://doi.org/10.1109/12.2166
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- On Random Pattern Test LengthIEEE Transactions on Computers, 1984
- An Experimental Delay Test Generator for LSI LogicIEEE Transactions on Computers, 1980