Néel “orange-peel” coupling in magnetic tunneling junction devices
- 3 October 2000
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 77 (15) , 2373-2375
- https://doi.org/10.1063/1.1315633
Abstract
We present measurements of the magnitude of Néel “orange-peel” coupling due to interface roughness in a series of magnetic tunneling junction devices. Results from magnetometry and transport measurements are shown to be in good agreement with the theoretical model of Néel. In addition, we have used transmission electron microscopy to directly probe the sample interface roughness and obtain results consistent with the values obtained by magnetometry and transport methods.Keywords
This publication has 10 references indexed in Scilit:
- Magnetization reversal and interlayer coupling in magnetic tunneling junctionsJournal of Applied Physics, 2000
- Two-dimensional magnetic switching of micron-size films in magnetic tunnel junctionsApplied Physics Letters, 2000
- Exchange-biased magnetic tunnel junctions: Dependence of offset field on junction widthApplied Physics Letters, 1999
- Effect of finite magnetic film thickness on Néel coupling in spin valvesJournal of Applied Physics, 1999
- Switching field interval of the sensitive magnetic layer in exchange-biased spin valvesJournal of Applied Physics, 1997
- Microstructured magnetic tunnel junctions (invited)Journal of Applied Physics, 1997
- Magnetic tunneling effect in Fe/Al2O3/Ni1−xFex junctionsJournal of Applied Physics, 1996
- Ferromagnetic–insulator–ferromagnetic tunneling: Spin-dependent tunneling and large magnetoresistance in trilayer junctions (invited)Journal of Applied Physics, 1996
- Large Magnetoresistance at Room Temperature in Ferromagnetic Thin Film Tunnel JunctionsPhysical Review Letters, 1995
- Giant magnetic tunneling effect in Fe/Al2O3/Fe junctionJournal of Magnetism and Magnetic Materials, 1995