Effects of Extraneous Materials in the Uni-Arc

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Abstract
The effects of extraneous materials in the point-to-plane Uni-Arc excitation of copper-base alloys were investigated. A number of materials were shown to increase markedly the line-to-background ratio. It was demonstrated that copper-containing materials could be used to obtain a constant intensity for the copper internal standard line despite wide variations in copper content from sample to sample, eliminating the need for concentration ratio methods in which the copper concentration must be known or determined. Data are presented which indicate that the technique is applicable to the point-to-plane analysis of a variety of copper-base alloys for trace constituents with a reasonable degree of precision and accuracy.

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