Structural studies of (Ga,In)(As,P) alloys and (InAs)m(GaAs)n strained-layer superlattices by fluorescence-detected EXAFS
- 31 December 1988
- journal article
- Published by Elsevier in Superlattices and Microstructures
- Vol. 4 (4-5) , 413-416
- https://doi.org/10.1016/0749-6036(88)90210-8
Abstract
No abstract availableKeywords
Funding Information
- Ministry of Education, Culture, Sports, Science and Technology
- Murata Science Foundation
This publication has 3 references indexed in Scilit:
- Fluorescence-Detected X-Ray Absorption Spectroscopy Applied to Structural Characterization of Very Thin Films; Ion-Beam-Induced Modification of Thin Ni Layers on Si(100)Japanese Journal of Applied Physics, 1985
- Extended x-ray-absorption fine-structure study ofrandom solid solutionsPhysical Review B, 1983
- Fluorescence detection of exafs: Sensitivity enhancement for dilute species and thin filmsSolid State Communications, 1977