Radiotracer measurements as a sensitive tool for the detection of metal penetration in molecular-based organic electronics
- 5 January 2005
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 86 (2) , 024104
- https://doi.org/10.1063/1.1849845
Abstract
The metallization of organic thin films is a crucial point in the development of molecular electronics. However, there is no method established yet to detect trace amounts of metal atoms in those thin films. Radiotracer measurements can quantify even very small amounts of material penetrating into the bulk, in our case less than 0.01% of a monolayer. Here, the application of this technique on two different well-characterized organic thin film systems (diindenoperylene and pentacene) is demonstrated. The results show that Ag is mainly adsorbed on the surface, but indicate that already at moderate deposition temperatures Ag can penetrate into the organic thin films and agglomerate at the film/substrate interface.Keywords
This publication has 13 references indexed in Scilit:
- Nanometer scale organic thin film transistors with PentaceneMicroelectronic Engineering, 2003
- High structural order in thin films of the organic semiconductor diindenoperyleneApplied Physics Letters, 2002
- Evidence of noble metal diffusion in polymers at room temperature and its retardation by a chromium barrierApplied Physics Letters, 2002
- Organic Thin Film Transistors for Large Area ElectronicsAdvanced Materials, 2002
- Condensation Coefficients of Ag on PolymersPhysical Review Letters, 1999
- Direct measurements of Cu diffusion into a polyimide below the glass transition temperatureApplied Physics Letters, 1989
- The microstructure of metal–polyimide interfacesJournal of Vacuum Science & Technology A, 1988
- Dry Etch Resistance of Organic MaterialsJournal of the Electrochemical Society, 1983
- Diffusion in the Amorphous Phase of Pd-19-at.%-Si Metallic AlloyPhysical Review Letters, 1975
- A UNIVERSAL MICROSECTIONING TECHNIQUE FOR DIFFUSIONApplied Physics Letters, 1970