Oxidation of clean silicon surfaces studied by four-point probe surface conductance measurements
- 20 April 1997
- journal article
- Published by Elsevier in Surface Science
- Vol. 377-379, 676-680
- https://doi.org/10.1016/s0039-6028(96)01470-7
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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