Measurements of the thickness dependence of the surface resistance of laser ablated high-T/sub c/ superconducting thin films
- 1 March 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 27 (2) , 872-875
- https://doi.org/10.1109/20.133312
Abstract
The authors report on measurements of the surface resistance of thin Y/sub 1/Ba/sub 2/Cu/sub 3/O/sub 7-x/ (TBCO) films made by laser ablation on SrTiO/sub 3/. Several films were prepared with thicknesses ranging from 100 nm to 400 nm. The surface resistance of these films was measured automatically in a temperature range from 20 K to 90 K using a copper cavity at 66.8 GHz. The measured values quantitatively show the expected temperature dependence of the effective surface resistance R/sub eff/ on the thickness of the superconducting films. From the measured R/sub eff/, one can calculate the true surface resistance R/sub ST/ by an analytical approximation which takes into consideration substrate losses and multireflections within the film. Results show that within the measurement uncertainty R/sub ST/ does not change with changing film thickness. At 77 K, R/sub ST/ values of about 15 m Omega were measured; at 30 K, R/sub ST/ reached 9 m Omega .Keywords
This publication has 7 references indexed in Scilit:
- Measurement of microwave surface resistance of patterned superconducting thin filmsJournal of Electronic Materials, 1990
- Temperature, frequency, and rf field dependence of the surface resistance of polycrystallinePhysical Review B, 1989
- Surface resistance of YBa2Cu3O7 films on SrTiO3 and LaGaO3 substratesApplied Physics Letters, 1989
- Surface resistance of polycrystalline high Tc superconductors between 3 and 90 GHzJournal of the Less Common Metals, 1989
- RF properties of high-T/sub c/ superconductorsIEEE Transactions on Magnetics, 1989
- Millimeter wave surface resistance of epitaxially grown YBa2Cu3O7−x thin filmsApplied Physics Letters, 1989
- Low-temperature preparation of superconducting YBa2Cu3O7−δ films on Si, MgO, and SrTiO3 by thermal coevaporationApplied Physics Letters, 1988