Surface-roughness measurement by digital processing of Nomarski phase-contrast images
- 1 November 1985
- journal article
- Published by Optica Publishing Group in Optics Letters
- Vol. 10 (11) , 526-528
- https://doi.org/10.1364/ol.10.000526
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 6 references indexed in Scilit:
- Measurement of surface topography of magnetic tapes by Mirau interferometryApplied Optics, 1985
- Influence of some parameters on the surface profile restored from microdensitometer analysis of electron micrographs of surface replicasApplied Optics, 1984
- The Scanning Fizeau Interferometer: An Automated Instrument For Characterizing Optical SurfacesOptical Engineering, 1980
- Quantitative surface topography determination by Nomarski reflection microscopy 2: Microscope modification, calibration, and planar sample experimentsApplied Optics, 1980
- Quantitative surface topography determination by Nomarski reflection microscopy I TheoryJournal of the Optical Society of America, 1979
- Interference Contrast Employed to Measure Slopes on Metallographic SpecimensReview of Scientific Instruments, 1966