Electron emission from ion-bombarded aluminum
- 1 November 1981
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 52 (11) , 6928-6933
- https://doi.org/10.1063/1.328646
Abstract
The secondary‐electron yield from polycrystalline aluminum induced by protons, noble‐gas ions, and aluminum ions has been measured as a function of ion energy in the range of 10 to 350 keV and as a function of angle of ion incidence in the interval of 0 ° to 70 °. The experimental data are compared with a theory of electron emission from solids proposed in our previous works. The agreement is good providing additional support for the theory.This publication has 8 references indexed in Scilit:
- Ion induced electron emission from polycrystalline copperNuclear Instruments and Methods in Physics Research, 1981
- Transport theory for kinetic emission of secondary electrons from solidsPhysical Review B, 1980
- Direct and recoil-induced electron emission from ion-bombarded solidsPhysical Review B, 1979
- Estimation of electron potential emission yield dependence on metal and ion parametersRadiation Effects, 1973
- Ultra high vacuum system for ion-solid collision investigations connected to a conventional ion acceleratorNuclear Instruments and Methods, 1972
- A study of the production and removal of radiation defects in Ge using secondary electron emissionRadiation Effects, 1972
- Spatial distribution of energy deposited into atomic processes in ion-implanted siliconRadiation Effects, 1970
- Energy Dissipation by Ions in the kev RegionPhysical Review B, 1961