Fourier Transform Ion Cyclotron Resonance of highly-charged atomic ions
- 1 December 1992
- journal article
- Published by IOP Publishing in Physica Scripta
- Vol. 46 (6) , 598-602
- https://doi.org/10.1088/0031-8949/46/6/019
Abstract
No abstract availableKeywords
This publication has 24 references indexed in Scilit:
- Doubly charged negative ions of carbon-60Physical Review Letters, 1991
- Observation of the doubly charged, gas-phase fullerene anions C602- and C702-Journal of the American Chemical Society, 1991
- Thermionic emission from giant fullerenesThe European Physical Journal D, 1991
- New developments in biochemical mass spectrometry: electrospray ionizationAnalytical Chemistry, 1990
- The use of an electron beam ion trap in the study of highly charged ionsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1989
- Physics of the EBIS and Its IonsPublished by Springer Nature ,1989
- Measurement of electron-impact–excitation cross sections for very highly charged ionsPhysical Review Letters, 1988
- The Electron Beam Ion Trap: A New Instrument for Atomic Physics MeasurementsPhysica Scripta, 1988
- The Electron Beam Method of Production of Highly Charged Ions and Its ApplicationsPhysica Scripta, 1983
- Fourier transform ion cyclotron resonance spectroscopyChemical Physics Letters, 1974