Microfabrication of a mechanically controllable break junction in silicon
- 21 August 1995
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 67 (8) , 1160-1162
- https://doi.org/10.1063/1.114994
Abstract
We present a detailed description of the fabrication and operation at room temperature of a novel type of tunnel displacement transducer. Instead of a feedback system it relies on a large reduction factor assuring an inherently stable device. Stability measurements in the tunnel regime infer an electrode stability within 3 pm in a 1 kHz bandwidth. In the contact regime the conductance takes on a discrete number of values when the constriction is reduced atom by atom. This reflects the conduction through discrete channels.Keywords
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