The phonon drag and diffusion thermopower of Si inversion layers
- 1 January 1990
- journal article
- Published by IOP Publishing in Journal of Physics: Condensed Matter
- Vol. 2 (3) , 755-761
- https://doi.org/10.1088/0953-8984/2/3/021
Abstract
New accurate results for the thermopower of Si inversion layers are compared with the calculated screened phonon-drag thermopower. Good agreement is obtained for both the temperature dependence and the magnitude, except at the lowest temperatures, when a change of sign to positive thermopower is observed. This the authors interpret as being due to the diffusion thermopower associated with surface roughness scattering.Keywords
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