The Oxford electron-beam ion trap: A device for spectroscopy of highly charged ions
- 1 April 1994
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 65 (4) , 1072-1074
- https://doi.org/10.1063/1.1145066
Abstract
An electron‐beam ion trap (EBIT) has just been completed in the Clarendon Laboratory, Oxford. The design is similar to the devices installed at the Lawrence Livermore National Laboratory. It is intended that the Oxford EBIT will be used for x‐ray and UV spectroscopy of hydrogenic and helium‐like ions, laser resonance spectroscopy of hydrogenic ions and measurements of dielectronic recombination cross sections, in order to test current understanding of simple highly charged ions.Keywords
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