High-sensitivity-coherent optical frequency-domain reflectometry for characterization of fiber-optic network components
- 1 June 1995
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Photonics Technology Letters
- Vol. 7 (6) , 667-669
- https://doi.org/10.1109/68.388759
Abstract
The authors have performed high-sensitivity-coherent optical frequency-domain reflectometry (OFDR) measurements of pig-tailed optical devices with centimeter resolution. The oscillations of the Rayleigh backscattering level produced by coherent fading noise was eliminated, strongly improving the capability of OFDR measurements of low level reflections and losses. Sensitivities down to -105 dB were achieved with minute measurement times.Keywords
This publication has 7 references indexed in Scilit:
- Experimental and theoretical investigations of coherent OFDR with semiconductor laser sourcesJournal of Lightwave Technology, 1994
- High-sensitivity low coherence reflectometer using erbium-doped superfluorescent fibre source and erbium-doped power amplifierElectronics Letters, 1993
- Coherent frequency-domain reflectometry for characterization of single-mode integrated-optical waveguidesJournal of Lightwave Technology, 1993
- Characteristics and reduction of coherent fading noise in Rayleigh backscattering measurement for optical fibers and componentsJournal of Lightwave Technology, 1992
- Jagged appearance of Rayleigh-backscatter signal in ultrahigh-resolution optical time-domain reflectometry based on low-coherence interferenceOptics Letters, 1991
- Submillimeter optical reflectometryJournal of Lightwave Technology, 1989
- Optical frequency domain reflectometry in single-mode fiberApplied Physics Letters, 1981