Study of afterglow in x-ray phosphors for use on fast-framing charge-coupled device detectors
- 1 November 1997
- journal article
- Published by SPIE-Intl Soc Optical Eng in Optical Engineering
- Vol. 36 (11) , 3212-3222
- https://doi.org/10.1117/1.601530
Abstract
There is a need in the x-ray imaging community for phosphors with short persistence (I/Io2O2S) with five different activators. The phosphor’s “practical efficiency” is presented for use with either front- or rear-illuminated CCDs. The persistence of these phosphors is characterized as a function of x-ray intensity, exposure time, and, when possible, impurity concentrations. Each phosphor’s usefulness for particular x-ray imaging experiments is also discussed. © 1997 Society of Photo-Optical Instrumentation Engineers.Keywords
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