Testability features of the SuperSPARC microprocessor
- 30 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Design for Testability—A SurveyIEEE Transactions on Computers, 1982
- Testing Memories for Single-Cell Pattern-Sensitive FaultsIEEE Transactions on Computers, 1980
- Efficient Algorithms for Testing Semiconductor Random-Access MemoriesIEEE Transactions on Computers, 1978