Chemical analysis of pulsed laser deposited a-CN films by comparative infrared and X-ray photoelectron spectroscopies
- 28 February 2000
- journal article
- Published by Elsevier in Surface and Coatings Technology
- Vol. 125 (1-3) , 308-312
- https://doi.org/10.1016/s0257-8972(99)00580-0
Abstract
No abstract availableKeywords
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