Evidence for microstructural inhomogeneity in sputtered Co-Cr thin films
- 15 March 1984
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 55 (6) , 2260-2262
- https://doi.org/10.1063/1.333629
Abstract
Thin films of the perpendicular recording material Co100−xCrx(x=17–23) were ion beam sputtered from alloy targets. The saturation magnetization and uniaxial anisotropy constant, as a function of temperature, both show a strong dependence on the substrate temperature during deposition Ts, indicating composition shifts which increase with Ts. The films have a columnar structure on a scale which does not depend on Ts in contrast to the grain size. From studies of the phase relations in bulk Co‐Cr alloys and diffusion couples it is concluded that phase separation of ordered Co‐Cr phases does not occur at high Ts. Instead the composition shifts and the grain refinement at higher Ts are proposed to be caused by oxygen gettering and oxide trapping during film growth.This publication has 7 references indexed in Scilit:
- Diffusion induced grain boundary migration and recrystallization in the CuNi systemScripta Metallurgica, 1983
- Magnetic properties and microstructure of CoCr based vertical recording materials prepared by ion beam sputteringJournal of Magnetism and Magnetic Materials, 1983
- Magnetic properties and anisotropy of Co-Cr alloyJournal of Magnetism and Magnetic Materials, 1983
- Co-Cr films with perpendicular magnetic anisotropyIEEE Transactions on Magnetics, 1981
- Co-Cr films for perpendicular recordingIEEE Transactions on Magnetics, 1981
- CoCr binary system: experimental re-determination of the phase diagram and comparison with the diagram calculated from the thermodynamic dataJournal of the Less Common Metals, 1978
- Interface reaction and a special form of grain boundary diffusion in the Cr-W systemActa Metallurgica, 1972